Events
Seminar Lausanne
Semiconductor & materials measurements, nanoprobing, EMC Testing, VNA Solutions for RF component
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Agenda (see below for details) 08.30 – 09.00 Welcome coffee Seminar 2 – EMC and RF 13.30 – 14.30 EMC Pre-Compliance Testing After the seminar, our experts are at your disposal |
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Use this opportunity to expand your network and share your experiences with the speakers and participants! |
Measurement systems for semiconductors and materials
You will learn the basics, tips and tricks for measuring DC (4 Quadrant) and AC voltage, understand sensitivityand how to perform high accurate measurements.
Speaker: Manfred Brenner, Application Engineer, Keithley
How to overcome challenges of in situ electrical nanoprobing in SEM
Nanoprobing in electron microscopes is a proven and increasingly used method to electrically characterize materials or precisely localize the root cause of defects in semiconductor devices.
This presentation will share recent technology advances, practical results and best practices, providing tips and tricks to overcome challenges of in situ nanoprobing.
Speaker: Mr. Guillaume Boetsch,
COO and founder of Imina Technologies SA
EMC Pre-Compliance Testing - new tools and approaches
Did you know that most projects fail EMI/EMC testing the first time? Avoid delays and save money by detecting compliance issues early. Performing pre-compliance testing improves the probability of a successful first pass of full EMI compliance testing.
In this seminar, we'll show you how to perform pre-compliance testing with cost-effective tools.
Speaker: Markus Petry, Applications Engineer, Tektronix
Vector Network Analyzer - Solutions for the characterization of RF components
IoT development requires VNAs to adapt Bluetooth, WLAN, RFID and other wireless solutions to the antenna.
The lecture deals with the basics of vector network analysis and demonstrates current measurement possibilities.
Speaker: Markus Petry, Applications Engineer, Tektronix
Seminar Thalwil
Semiconductor & materials measurements, nanoprobing, EMC Testing, VNA Solutions for RF component
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Agenda (see below for details) 08.30 – 09.00 Welcome coffee Seminar 2 – EMC and RF 13.30 – 14.30 EMC Pre-Compliance Testing After the seminar, our experts are at your disposal |
|
Use this opportunity to expand your network and share your experiences with the speakers and participants! |
Measurement systems for semiconductors and materials
You will learn the basics, tips and tricks for measuring DC (4 Quadrant) and AC voltage, understand sensitivityand how to perform high accurate measurements.
Speaker: Manfred Brenner, Application Engineer, Keithley
How to overcome challenges of in situ electrical nanoprobing in SEM
Nanoprobing in electron microscopes is a proven and increasingly used method to electrically characterize materials or precisely localize the root cause of defects in semiconductor devices.
This presentation will share recent technology advances, practical results and best practices, providing tips and tricks to overcome challenges of in situ nanoprobing.
Speaker: Mr. Guillaume Boetsch,
COO and founder of Imina Technologies SA
EMC Pre-Compliance Testing - new tools and approaches
Did you know that most projects fail EMI/EMC testing the first time? Avoid delays and save money by detecting compliance issues early. Performing pre-compliance testing improves the probability of a successful first pass of full EMI compliance testing.
In this seminar, we'll show you how to perform pre-compliance testing with cost-effective tools.
Speaker: Markus Petry, Applications Engineer, Tektronix
Vector Network Analyzer - Solutions for the characterization of RF components
IoT development requires VNAs to adapt Bluetooth, WLAN, RFID and other wireless solutions to the antenna.
The lecture deals with the basics of vector network analysis and demonstrates current measurement possibilities.
Speaker: Markus Petry, Applications Engineer, Tektronix
Sindex 2018
Vom 28. - 30. August 2018 findet in Bern die nächste SINDEX statt. Jetzt Datum reservieren und mit dabei sein!
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Gerne senden wir Ihnen ein kostenloses Ticket. Einfach eine e-mail an sindex_freeticket@linktronix.ch
Wir freuen uns auf Ihren Besuch am Linktronix Stand in der Halle 2.2 / C17
Seminar on research and analysis of semiconductors and materials
Seminar on research and analysis of semiconductors and materials.
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Agenda
09.30 – 10.00 Welcome coffee
10.00 – 12.00 Basics, tips and tricks for semiconductor measurements
12.00 – 13.30 Lunch
13.30 – 15.30 Basics, tips and tricks for probe systems
15.40 Open End
After the seminar, our experts are at your disposal
for individual questions or demos.
Date: Wed, 8. Nov. 2017
Location: Golden View, Zürcherstrasse 59, 8800 Thalwil
Costs: none
Registration deadline: 03.11.2017
The seminar will take place if there are at least 10 participants.
Language: English, Slides: English
Arrival: free parking around the Silvergate building,
Bus stop Thalwil Böni 200m
Messtechnik Seminar - EMV, VNA, Jitter, galvanisch getrennte Tastköpfe
Seminar zum Thema EMV, VNA, Jitter, galvanisch getrennte Tastköpfe
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Agenda
08.30 – 09.00 Begrüssung
09.00 – 10.00 EMV Pre-Compliance Test – neue Werkzeuge und Ansätze
10.00 – 10.30 Kaffee und Gipfeli
10.30 – 11.30 Neuartiges Messsystem mit galvanisch getrenntem Messkopf
11.30 – 13.00 Mittagessen (individuell)
13.00 – 14.00 Hochauflösende breitbandige Erfassungssysteme
14.00 – 14.30 Kaffee und Kuchen
14.30 – 15.30 Vektor Netzwerkanalysator
15.30 – 15.45 Pause
15.45 – 16.45 Jitter-Messung und Timing-Analyse
Datum: Di, 5. Sept. 2017
Ort: Golden View, Zürcherstrasse 59, 8800 Thalwil
Dauer: 1 Tag
Kosten: keine
Anmeldeschluss: 28.8.2017
Das Seminar findet ab 10 Teilnehmern statt.
Sprache: Deutsch, Folien: Englisch
Verpflegung: Kaffee, Gipfeli, Kuchen sind offeriert
Anreise: kostenlose Parkmöglichkeiten rund um das Silvergate Gebäude,
Bushaltestelle Thalwil Böni 200m
26 - 30 from 47
